Now showing items 1-1 of 1

    • Soft error-aware leakage reduction through body bias 

      Sootkaneung, Warin; Howimanporn, Suppachai; Chookaew, Sasithorn (2018-07-03)
      For modern processors, two reliability issues, namely increased leakage power and soft error rate, continue to intensify as device technologies scale down to nanometers. While many researchers have proposed methods to ...