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Particle swarm optimization based NBTI modeling for finFET circuits
Fin Field Effect Transistor (FinFET) technology has increasingly been adopted for use within integrated circuits thanks to its superior electrical integrity and scalability. However, a steady increase in vulnerability of ...
Soft error-aware leakage reduction through body bias
For modern processors, two reliability issues, namely increased leakage power and soft error rate, continue to intensify as device technologies scale down to nanometers. While many researchers have proposed methods to ...